The CS548 isolated-channel oscilloscope provides a complete solution for Double Pulse Testing (DPT), critical in characterizing transistor switching performance. Its unique isolation capabilities make it especially suitable for measuring high-side transistors where standard oscilloscopes fall short due to common-mode voltage limitations.

The system leverages a fiber-isolated measuring approach, achieving exceptional common-mode rejection required for analyzing the extremely rapid transitions characteristic of GaN and SiC transistors. By integrating with the CS1097 GaN half-bridge tester, equipped with EPC2304 GaN FETs, it accurately measures transistor parameters such as inductance, capacitance, RDSON, conduction energy, switching power, and gate drive characteristics.

The DPT methodology ensures precise control over transistor operating conditions. Utilizing pulse accumulation mode, users can consistently replicate tests for detailed waveform analysis with sub-nanosecond timing precision. The suite’s robust calculation features quickly interpret results, simplifying complex analyses such as inductance calculations (Lbl), output capacitance (CQH), and energy integration for switching events.

This oscilloscope is ideal for detailed semiconductor testing applications, aligning perfectly with transistor manufacturers, power electronics researchers, and engineers designing next-generation power conversion systems.